Programming in a memory device

ABSTRACT

Methods for programming a memory device, memory devices, and a memory systems are provided. According to at least one such method, a selected memory cell is programmed by a series of programming pulses. The series of programming pulses are configured in sets of programming pulses where each set has the same quantity of pulses and each programming pulse in the set has substantially the same amplitude (i.e., programming voltage). The amplitude of the programming pulses of subsequent sets is increased by a step voltage from the previous amplitude.

RELATED APPLICATION

This application claims priority to Italian Patent Application SerialNo. RM2008A000693, filed Dec. 24, 2008, entitled “PROGRAMMING IN AMEMORY DEVICE,” which is commonly assigned.

TECHNICAL FIELD OF THE INVENTION

The present invention relates generally to memory devices and in aparticular embodiment the present invention relates to non-volatilememory devices.

BACKGROUND OF THE INVENTION

Memory devices are typically provided as internal, semiconductor,integrated circuits in computers or other electronic devices. There aremany different types of memory including random-access memory (RAM),read only memory (ROM), dynamic random access memory (DRAM), synchronousdynamic random access memory (SDRAM), and flash memory.

A flash memory is a type of memory that can be erased and reprogrammedin blocks instead of one byte at a time. A typical flash memorycomprises a memory array that includes a large number of memory cells.Each of the memory cells includes a floating gate field-effecttransistor capable of holding a charge. The cells are usually groupedinto blocks of 64 pages of single level cells (SLC) or 128 pages ofmultilevel cells (MLC), where each page is typically 2048 bytes of dataon 32 word lines. Each of the cells within a block can be electricallyprogrammed on a random basis by charging the floating gate.

The data in a cell is determined by the presence or absence of charge onthe floating gate. Each memory cell can be programmed as an SLC or MLC.Each cell's threshold voltage (V_(t)) determines the data that is storedin the cell. For example, in an SLC, a V_(t) of 0.5V can indicate aprogrammed cell while a V_(t) of −0.5V might indicate an erased cell.The multilevel cell has multiple V_(t) ranges that each indicates adifferent state. Multilevel cells can take advantage of the analognature of a traditional flash cell by assigning a bit pattern to aspecific voltage distribution for the cell. This technology permits thestorage of two or more bits per cell, depending on the quantity ofvoltage ranges assigned to the cell. The charge can be removed from thefloating gate by a block erase operation.

FIG. 1 illustrates a typical prior art V_(t) distribution diagram wherethe vertical axis is the quantity of cells and the horizontal axis isthe threshold voltage V_(t). The most negative state 101 is typicallyreferred to as the erased state, has a negative voltage, and istypically represented as a logical “11”. The programmed states aretypically referred to as logical “01” 102, logical “00” 103, and logical“10” 104 states and are programmed from the erased state 101.

The variations in each V_(t) distribution width 110 is an importantparameter to control during programming. The tightest possibledistribution is desired, as shown in FIG. 1, in order to produce greaterspacing 115 between each of the states 101-104. This enables easierdiscrimination between states 101-104 since the possibility of a highervoltage of one distribution overlapping a lower V_(t) of the nextdistribution is reduced.

As illustrated in FIG. 2, conventional SLC and MLC programming useincrementally increasing (e.g., ΔV) programming pulses 200 that areapplied to the access lines (e.g., word lines) of the memory cell arrayto achieve discrete levels of V_(t) for the cells in the array. Betweeneach program pulse, a verify is performed to determine if the cell'starget V_(t) has been achieved. Memory cells that have reached theirtarget V_(t) are inhibited from further programming during subsequentpulses by biasing of the data line (e.g., bit line).

FIG. 2 shows an initial erased distribution 201 that is moved to a morepositive, programmed state by the application of the programming pulses200 to control gates of the memory cells. The programming pulses startat V_(start) and increment by a step voltage ΔV from the previous pulse.After the first programming pulse, the distribution 202 has movedtowards the 0V origin. The third programming pulse has slightlytightened the distribution 203 as well as moved it in a positivedirection. The fourth programming pulse has moved and tightened thedistribution 204 even further.

It can be seen from FIG. 2 that the width of the distribution is drivenby the programming pulse step voltage. If the step voltage is reduced,the final distribution width is reduced. However, there is a point atwhich reducing the step voltage has no further affect on thedistribution width. At this point, a “saturation” of the distributionwidth has been reached. This saturation area can be different for eachmemory cell. Thus, even if the program step voltage is ΔV, the finaldistribution width might be greater than ΔV.

An additional problem with reducing the programming step voltage is theaffect on programming throughput. As the step voltage is reduced, theamount of time required to program a memory cell is increased.

For the reasons stated above, and for other reasons stated below whichwill become apparent to those skilled in the art upon reading andunderstanding the present specification, there is a need in the art fora way to reduce V_(t) distribution width without significantly impactingthe programming throughput of the memory device.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows a typical prior art threshold voltage distribution diagram.

FIG. 2 shows a typical prior art programming pulses and the resultingaffect on the threshold voltage distribution.

FIG. 3 shows a schematic diagram of one embodiment of a non-volatilememory array.

FIG. 4 shows programming and verify pulses for one embodiment of aprogramming method.

FIG. 5 shows a plot of a control gate voltage during a typical prior artprogramming operation.

FIG. 6 shows a plot of a control gate voltage during one embodiment ofthe programming method of the present disclosure.

FIG. 7 shows a flowchart of one embodiment of the programming method ofthe present disclosure.

FIG. 8 shows a simplified block diagram of one embodiment of a memorysystem of the present invention.

DETAILED DESCRIPTION

In the following detailed description of the invention, reference ismade to the accompanying drawings that form a part hereof, and in whichis shown, by way of illustration, specific embodiments in which theinvention may be practiced. In the drawings, like numerals describesubstantially similar components throughout the several views. Theseembodiments are described in sufficient detail to enable those skilledin the art to practice the invention. Other embodiments may be utilizedand structural, logical, and electrical changes may be made withoutdeparting from the scope of the present invention. The followingdetailed description is, therefore, not to be taken in a limiting sense,and the scope of the present invention is defined only by the appendedclaims and equivalents thereof.

FIG. 3 illustrates a schematic diagram of a portion of a NANDarchitecture memory array comprising series strings of non-volatilememory cells on which the embodiments of the subsequently discussed datacollection and compression/decompression can operate. While thesubsequent discussions refer to a NAND memory device, the presentembodiments are not limited to such an architecture but can be used inother memory device architectures as well. For example, alternateembodiment arrays could be organized in NOR or AND architectures.

The memory array is comprised of an array of non-volatile memory cells301 (e.g., floating gate) arranged in columns such as series strings304, 305. Each of the cells 301 is coupled drain to source in eachseries string 304, 305. A word line WL0-WL31 that spans across multipleseries strings 304, 305 is connected to the control gates of each memorycell in a row in order to bias the control gates of the memory cells inthe row. The bit lines BL1, BL2 are eventually connected to senseamplifiers (not shown) that detect the state of each cell by sensingcurrent on a particular bit line.

Each series string 304, 305 of memory cells is coupled to a source line306 by a source select gate transistor 316, 317 and to an individual bitline BL1, BL2 by a drain select gate transistor 312, 313. The sourceselect gate transistors 316, 317 are controlled by a source select gatecontrol line SG(S) 318 coupled to their control gates. The drain selectgate transistors 312, 313 are controlled by a drain select gate controlline SG(D) 314.

The memory array can be organized as memory blocks. The quantity ofmemory blocks is typically determined by the size of the memory device(i.e., 512 MB, 1 GB). In one embodiment, each memory block programmed inan SLC manner is comprised of 64 pages. In another embodiment, a memoryblock programmed in an MLC manner is comprised of 128 pages. Each pagecan be comprised of 2048 bytes of data on 32 word lines.

FIG. 4 illustrates a series of programming and verify pulses inaccordance with one embodiment of a method for programming such as themethod of FIG. 7. The method is subsequently described as it applies toa memory cell. However, a flash memory device is typically erased andprogrammed on a memory block-by-memory block basis. Thus the describedprogramming method embodiments can be expanded to program entire memoryblocks as well as other groups of memory cells.

The embodiment of FIG. 4 shows both the programming pulse 410 that isapplied to the control gates of the memory cells for programming and thesubsequent verify pulse 415 that is applied to the control gates of thememory cells for program verification. Instead of increasing eachsubsequent programming pulse, as is done in the prior art programmingoperations, the method illustrated in FIG. 4 generates a number ofprogramming pulses at substantially the same control gate voltage (i.e.,the amplitude of the programming pulse) before increasing the voltagefor the next set of programming pulses.

Using a number of programming pulses at the same program voltage pushesthe memory cells into the saturation area more quickly than increasingthe program voltage with every pulse. The saturation condition occurswhen the threshold voltage (V_(t)) of the memory cell moves, byincreasing the gate voltage (V_(g)), according to the cell couplingfactor equation dV_(t)=K*dV_(g). In other words, the rate of change ofthe threshold voltage is equal to a constant times the rate of change ofthe memory cell gate voltage. If programming pulses have a small pulsewidth, even a large V_(g) step voltage will not move the thresholdvoltage of the memory cell as quickly as programming pulses having alarger pulse width.

The slow movement of the threshold voltage does not typically occur ifthe same gate voltage is used over many pulses, as in the presentprogramming embodiments. The multiple programming pulses with the samegate voltage in each set of programming pulses moves the thresholdvoltage more quickly to the saturation region. Also, the multipleprogramming pulses at the same gate voltage provide a threshold voltagethat is much closer to one that can be calculated using the couplingfactor equation above.

The embodiment of FIG. 4 shows three programming pulses in each set ofprogramming pulses having the same amplitude/V_(g). This is for purposesof illustration only as the present embodiments are not limited to anyone quantity of programming pulses in each set. The quantity ofprogramming pulses in each set is determined experimentally based on thememory technology. For example, a nitride charge storage layer might usea different quantity of programming pulses per set than a polysiliconcharge storage layer. Similarly, programming an MLC memory device mightrequired more pulses per set than programming an SLC memory device.

The embodiment of FIG. 4 shows a first set of programming pulses 401 atthe initial programming voltage (e.g., 15V). The programming voltage isthen increased by the step voltage ΔV (e.g., 0.2V) to the programmingvoltage (e.g., V_(g)=15.2V) for the next set of programming pulses 402.Similarly, the programming pulses are increased by the step voltage tothe next programming voltage (e.g., V_(g)=15.4V) for the next set ofprogramming pulses. A program verify operation with the verify pulse 415is performed between each programming pulse in each set of programmingpulses. This process is repeated until the memory cell is verified asbeing programmed or an error condition occurs when the memory cellcannot be verified as programmed.

The verify operation is a form of memory cell read that biases thememory cell control gate with verify pulse at a read voltage that can bewithin the allocated range of threshold voltages for reading. The readvoltage turns on the memory cell and enables the sense circuitry tocompare the resulting current on the bit line with a reference currentto determine if the memory cell is programmed to the target thresholdvoltage. If the memory cell has reached the target threshold voltage,the bit line coupled to that memory cell is biased at an inhibit voltage(e.g., V_(CC)) to inhibit further programming of that memory cell duringthe present memory block programming. In the position between twoprogramming pulses of the same voltage, the threshold voltage shift islower, thus increasing the threshold voltage resolution. This concept isillustrated in FIGS. 5 and 6.

FIG. 5 illustrates a plot of a control gate voltage during a typicalprior art programming operation. This plot shows a curve 510 for whenthe programming pulse has an amplitude of 14.5V (i.e., V_(g)=14.5V) andanother curve 511 for when the programming pulse has an amplitude of15.0V. Each programming pulse has a pulse width of time T 501.

During the illustrated programming operation, an initial programmingpulse at 14.5V results in the increase along the 14.5V curve as shown bythe vertical increase 502. A step voltage of 0.5V is added to theinitial 14.5V resulting in the second pulse having an amplitude of15.0V. This second pulse, having the T pulse width, results in theincrease along the 15V curve 511 as shown by the second verticalincrease 503.

FIG. 5 shows the large increases 502, 503 resulting from two programmingpulses of the prior art programming method. Such large increases canresult in over-programming of a memory cell if its target thresholdvoltage is, for example, somewhere along the 15V curve between the endof the first programming pulse and the end of the second programmingpulse. Such a programming operation would also result in a much widerthreshold voltage distribution for the target state due to the inabilityto the large increases from one programming pulse to the next.

FIG. 6 illustrates a plot of a control gate voltage as a result of theembodiments of the present programming method. This plot shows the same14.5V Vg curve 600 and the 15V curve 620 as in the prior art method ofFIG. 5. However, each programming pulse of width T 601-603 and amplitude14.5V results in much smaller vertical increases 611-613 along the 14.5Vcurve. When the programming voltage is increased with a step voltage of0.5V from 14.5V to 15V, the movement along the 15V curve 620 alsoindicates a short vertical increase 614. Thus, the embodiments of thepresent programming method would generate substantially narrowerthreshold voltage distributions as a result of these reduced increases.

FIG. 7 illustrates a flow chart of one embodiment of the method forprogramming a memory device. Since flash memory cells are programmedfrom an erased state on a block-by-block basis, the first step is anerase operation on the erase block 701. However, if a programmingembodiment is performed on a different technology not requiring anerased state, the erase operation 701 is not required.

The programming pulses at the initial programming voltage (e.g., 15V)are generated 703. As discussed previously, the programming voltage isthe voltage used to bias the control gate of the memory cell or cellsbeing programmed and is typically applied to a selected word line thatcouples the row of memory cells being programmed.

A verify operation is then performed 705 to determine if the memory cellor cells being programmed have reached their respective target thresholdvoltage. The memory cells that have been programmed to their respectivetarget threshold voltage 707 are inhibited from further programmingduring this operation by bit line biasing or some other inhibit method.

If the memory cells being programmed have not reached their respectivetarget threshold voltage, it is determined if all of the programmingpulses in the present set of programming pulses have been applied 709.If not all of the programming pulses in a particular set of programmingpulses have been applied, another programming pulse having the sameamplitude as the previous pulse is generated 713 to bias the selectedword line after which a verify operation is again performed 705.

If all of the predetermined quantity of programming pulses for aparticular amplitude has been generated 709 and the memory cells beingprogrammed have not reached their respective target threshold voltage, astep voltage is added to the current program voltage 711 and anotherprogramming pulse at the new voltage is generated 713. This process isrepeated until the memory cells are programmed or an error conditionoccurs when the selected memory cells cannot be programmed.

FIG. 8 illustrates a functional block diagram of a memory system 820that includes a memory device 800. The memory device 800 has beensimplified to focus on features of the memory that are helpful inunderstanding the present embodiments for memory programming. The memorydevice 800 is coupled to a system controller 810. The controller 810 maybe a microprocessor or some other type of controller.

The memory device 800 includes an array 830 of non-volatile memorycells, such as the series strings illustrated in FIG. 3 and discussedpreviously. The memory array 830 is arranged in banks of word line rowsand bit line columns. In one embodiment, the columns of the memory array830 are comprised of series strings of memory cells. As is well known inthe art, the connections of the cells to the bit lines determineswhether the array is a NAND architecture, an AND architecture, or a NORarchitecture.

Address buffer circuitry 840 is provided to latch address signalsprovided through the 1/0 circuitry 860. Address signals are received anddecoded by a row decoder 844 and a column decoder 846 to access thememory array 830. It will be appreciated by those skilled in the art,with the benefit of the present description, that the number of addressinput connections depends on the density and architecture of the memoryarray 830. That is, the number of addresses increases with bothincreased memory cell counts and increased bank and block counts.

The memory device 800 reads data in the memory array 830 by sensingvoltage or current changes in the memory array columns using senseamplifier circuitry 850. The sense amplifier circuitry 850, in oneembodiment, is coupled to read and latch a row of data from the memoryarray 830. I/O circuitry 860 is included for bidirectional datacommunication as well as address communication over a plurality of dataconnections 862 with the controller 810. Write circuitry 855 is providedto program data to the memory array 830.

Memory control circuitry 870 decodes signals provided on controlconnections 872 from the controller 810. These signals are used tocontrol the operations on the memory array 830, including data read,data write (program), and erase operations. The memory control circuitry870 may be a state machine, a sequencer, or some other type of controlcircuitry to generate the memory control signals. In one embodiment, thememory control circuitry 870 is configured to transfer data to thememory array 830 for execution of the programming embodiments discussedpreviously. The memory control circuitry 870 is further configured toread data from the memory array 830.

The memory device illustrated in FIG. 8 has been simplified tofacilitate a basic understanding of the features of the memory. A moredetailed understanding of internal circuitry and functions of flashmemories are known to those skilled in the art.

Conclusion

In summary, one or more embodiments of the present invention provide amethod for programming, such as solid state memory devices, in order toproduce narrow V_(t) distributions without greatly impacting programmingspeed. For example, this can be accomplished by biasing control gates ofselected memory cells (e.g., through word lines) with sets ofprogramming pulses where each pulse in the set of programming pulses hasthe same amplitude. Subsequent sets of programming pulses are generatedby adding a step voltage ΔV to the current voltage. This is repeateduntil the target memory cells are programmed to their respective targetthreshold voltages.

Although specific embodiments have been illustrated and describedherein, it will be appreciated by those of ordinary skill in the artthat any arrangement that is calculated to achieve the same purpose maybe substituted for the specific embodiments shown. Many adaptations ofthe invention will be apparent to those of ordinary skill in the art.Accordingly, this application is intended to cover any adaptations orvariations of the invention. It is manifestly intended that thisinvention be limited only by the following claims and equivalentsthereof.

1. A method for programming a memory cell, the method comprising:applying a plurality of programming pulses to the memory cell whereinthe plurality of programming pulses is comprised of a plurality of setsof programming pulses wherein all of the programming pulses in arespective one of the sets are substantially equal in amplitude and atleast one of the sets has a different amplitude from at least anotherone of the sets; and determining if the memory cell has reached a targetthreshold voltage between each of the plurality of programming pulses.2. The method of claim 1 and further including initially erasing thememory cell.
 3. The method of claim 2 wherein erasing the memory cellcomprises causing the memory cell to have a negative threshold voltage.4. The method of claim 1 wherein determining if the memory cell hasreached a target threshold voltage comprises applying a verify pulsehaving a read voltage to the memory cell.
 5. The method of claim 4wherein the read voltage is within an allocated range of thresholdvoltages for reading.
 6. The method of claim 1 wherein each subsequentset of programming pulses has a greater programming pulse amplitude thana previous set.
 7. The method of claim 6 wherein an amplitude of theprogramming pulses of each respective one of the subsequent sets isgreater than the amplitude of the previous set of programming pulses bya step voltage.
 8. The method of claim 1 and further comprisingdetermining a quantity of programming pulses in each set of programmingpulses in response to a type of memory cell.
 9. A method for programminga plurality of memory cells, the method comprising: applying a firstplurality of programming pulses to selected memory cells of theplurality of memory cells, the first plurality of programming pulses allhaving a first programming voltage; and determining if the selectedmemory cells have each reached a respective target threshold voltagebetween each of the first plurality of programming pulses.
 10. Themethod of claim 9 and further including: applying a second plurality ofprogramming pulses to those selected memory cells that have not reachedtheir respective target threshold voltage, wherein the second pluralityof programming pulses all have a second programming voltage that isgreater than the first programming voltage; and determining if theselected memory cells have each reached their respective targetthreshold voltage between each of the second plurality of programmingpulses.
 11. The method of claim 10 and further including applyingadditional pluralities of programming pulses, and determining if theselected memory cells have reached their respective target thresholdvoltage between each programming pulse, to those selected memory cellsthat have not reached their respective target threshold voltages whereineach of the additional pluralities of programming pulses have greaterprogramming voltages than a previous plurality of programming pulses andall programming pulse within each plurality of programming pulses havesubstantially the same programming voltage.
 12. The method of claim 11wherein the second programming voltage is substantially equal to thefirst programming voltage plus a step voltage and the programmingvoltage of each subsequent plurality of programming pulses is greaterthan the programming voltage of the previous plurality of programmingpulses by the step voltage.
 13. The method of claim 9 wherein eachprogramming pulse is applied to at least one access line coupled to theselected memory cells.
 14. A method for programming a memory device, themethod comprising: erasing a selected memory block having a plurality ofaccess lines with a plurality of memory cells coupled to each accessline; applying at least one programming pulse of a set of apredetermined quantity of programming pulses to a selected access lineof the plurality of access lines, the set of the predetermined quantityof programming pulses having a first programming voltage; performing aprogram verify operation on the selected access line after eachprogramming pulse; applying additional programming pulses to theselected access line if the program verify operation indicates a memorycell coupled to the selected access line is not programmed to a targetthreshold voltage, wherein the additional programming pulses arecomprised of additional sets of programming pulses, each set ofprogramming pulses comprising the predetermined quantity of programmingpulses and each programming pulse in a set of programming pulses havingsubstantially the same programming voltage.
 15. The method of claim 14wherein a data line coupled to programmed memory cells that pass theprogram verify operation is biased to inhibit further programming of theprogrammed memory cells.
 16. The method of claim 14 wherein the at leastone programming pulse moves a threshold voltage of a selected memorycell from a negative threshold voltage to a positive, target thresholdvoltage.
 17. The method of claim 14 wherein the programming voltage ofthe other set is greater than the first voltage by a step voltage. 18.The method of claim 14 wherein the first programming voltage is acontrol gate voltage that is applied to each control gate of selectedmemory cells coupled to the selected access line.
 19. A memory devicecomprising: a memory array comprising a plurality of non-volatile memorycells; and control circuitry coupled to the memory array and configuredto control operation of the memory array, the control circuitry furtherconfigured to control generation of a plurality of sets of programmingpulses wherein each set of programming pulses is comprised of a samepredetermined plurality of programming pulses and each programming pulsein a respective one of the sets is generated at a substantially equalamplitude as the other programming pulses in the respective set.
 20. Thememory device of claim 19 wherein the memory array is comprised of aNAND architecture of flash memory cells.
 21. A memory system comprising:a controller configured to control operation of the memory system; and anon-volatile memory device, coupled to the controller, that operates inresponse to the controller, the non-volatile memory device comprising: amemory array comprising a plurality of memory cells; and controlcircuitry coupled to the memory array and configured to controlprogramming of the memory array wherein the control circuitry isconfigured to control generation of a plurality of sets of programmingpulses, each programming pulse having a programming voltage, whereineach set comprises a plurality of programming pulses and eachprogramming pulse in a set has substantially the same programmingvoltage that is different from the programming voltages of the othersets of programming pulses.
 22. The memory system of claim 21 whereinthe control circuitry is further configured to control bias of a dataline with a voltage that either slows or inhibits programming of atarget memory cell in response to a threshold voltage of the targetmemory cell being reached.
 23. The memory system of claim 21 wherein thecontrol circuitry is further configured to control generation of verifypulses between each of the programming pulses.